Agri Products Edu Products

Four Probe Method For Resistivity Measurement

SKU Item Code: SK012 Category

Principle and Working:

Additional information

Salient Features

  • Built-in Temperature sensor with seven segment digital display.
  • Dual Purpose seven segment digital display.
  • Multi-Turn Pot for fine tunning of Current.
  • Pointed spring loaded probes ensure good electrical contacts with the sample.
  • Different types of Semiconductor Sample can be used for measurement.

Objectives

  • Measurement of resistivity of semiconductor by four probe method.
  • Determination of Energy Band Gap.

Technical Data

  • Power supply : Voltage range X1 (0-200.0mV DC) & X10 (0- 2.00 V DC), Current Range 0-20mADC,
  • Oven Supply : 60V AC, Heating resistance 35 ohm, Temp. range ambient to 200º C, Fuse 2A
  • Temp. sensor : PT100, range -10º C to 250º C
  • Four Probe : Spring loaded, Spacing 25mm, Connection Arrangement 4mm safety socket
  • Arrangement 4mm safety socket
  • Sample : P type Ge Wafer, Size : 12 x14 x 0.5mm Resistivity 1~10 ohm-cm, Orientation<100>

Scope of Delivery

  • 1 Four probe power supply
  • 1 P-Type Ge Crystal
  • 1 Oven
  • 1 Four probe arrangement
  • 1 Sample crystal (p-type Ge)
  • 1 PT 100, Temperature sensor (Fixed)
  • 1 Screw driver
  • 1 Power cord
  • 1 N-Type Ge Crystal (Optional)
Fill out the Form and Download the Product List
Fill out the Form and Download the Product List